ION-TOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometers (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). The company is the leading European manufacturer of Time-of-Flight Secondary Ion Mass Spectrometers (TOF-SIMS) for surface analysis.
Today, ION-TOF GmbH is known for its innovative ion beam technology for surface analysis with different product lines in TOF-SIMS and LEIS.
TOF-SIMS and many of its applications have been pioneered by Prof. Benninghoven and his group in the early 80’s.
Two instrument generations for surface spectroscopy were developed at the University of Muenster. In 1989 ION-TOF started to commercialise the technique and has continued the development of TOF-SIMS instrumentation.
In 2007 ION-TOF expanded its product range to the complementary technique of high sensitivity low energy ion scattering (LEIS). Based on the pioneering research and instrument development carried out by Professor Brongersma and his group at the Eindhoven University of Technology, carried forward by Calipso BV, and their long term application experience, ION-TOF has developed the next generation of LEIS instruments.