Low Energy Ion Scattering (LEIS)
The Qtac is a high sensitivity Low Energy Ion Scattering (LEIS) instrument. It is extremely surface sensitive, providing quantitative elemental characterisation of the top atomic layer.
This instrument has been developed to include small spot analysis, surface imaging, and both static and dynamic depth profiling.
Its unique surface sensitivity makes the Qtac the perfect tool to study surface processes. The Qtac provides valuable information in many production and research areas on materials such as catalysts, semiconductors, metals, polymers, and fuel cells.
(Рус) Qtac 100
Vendor: ION-TOF
Specification3000 times higher sensitivity than conventional LEIS instruments Quantitative, elemental characterisation of the top atomic layer Spectroscopy, imaging and depth profiling capabilities Time-of-flight mass filtering for improved sensitivityAnalysis of rough and non-conductive materialsApplicationThe stand-alone version of the Qtac is based on a field-proven instrument platform. The modular design is ideal for customisation and the integration of a large variety of UHV preparation techniques. It is also possible to couple the Qtac100 to other floor standing instruments.