The single crystal X-ray difraction technique is a simple and relatively cheap way of obtaining data about organic and inorganic molecules structure.
Leading edge solutions for nanomaterial studies.
Каталог оборудования для спектроскопии оптической: спектрометры, электроника и детекторы для счета фотонов. Заказать системы спектроскопии оптической в компании ТехноИнфо
This high-resolution AFM (Atomic Force Microscope) of less than 25 mm diameter was designed to fit perfectly into the PPMS® (Physical Property Measurement System) of Quantum Design. It offers all common measurement modes, such as contact mode and intermittent contact mode, plus the PLL-controlled true non-contact mode and high-resolution MFM mode. Joining the AFM with the PPMS® provides the researcher with a versatile nanoscale imaging tool in a variable temperature and variable magnetic field environment. The broad temperature range of 4–400 K and the available magnetic field options of up to 16 T promise exciting new studies on phase transitions, superconductors, magnetic thin films, 2DEG, etc.
Especially designed for research, development and quality control of magnetic storage media and other magnetic material, the hr-MFM (high-resolution Magnetic Force Microscope) is an analytical and quantitative magnetic imaging system. Its exceptionally high magnetic resolution of 10 nm or better matches the best results obtained by SEMPA (Scanning Electron Microscopy with Polarization Analysis) on disk media.The hr-MFM is a key instrument in the improvement of the current hard disk technology and is optimized for research and development departments of the data storage industry. In Research Centers and Universities it is an excellent tool to analyze surface structures and to characterize new magnetic materials and thin film technology, for example magnetic quantum dots and layered nanostructures for mRAM and FeRAM applications.