Qtac 100

Vendor: ION-TOF

Specification3000 times higher sensitivity than conventional LEIS instruments Quantitative, elemental characterisation of the top atomic layer Spectroscopy, imaging and depth profiling capabilities Time-of-flight mass filtering for improved sensitivityAnalysis of rough and non-conductive materialsApplicationThe stand-alone version of the Qtac is based on a field-proven instrument platform. The modular design is ideal for customisation and the integration of a large variety of UHV preparation techniques. It is also possible to couple the Qtac100 to other floor standing instruments.