XtaLAB Synergy-DW

Rigaku XtaLAB Synergy-DW

Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments.


One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of research interests.

  • Access to two wavelengths in one compact system
  • 12x higher flux than sealed tube X-ray sources
  • Low maintenance, high performance system
  • Uses CrysAlis Pro software with both PX and SMX modes

Configuration

The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode. The target is constructed with two different X-ray source materials (Cu and Mo) and is coupled with an auto-switching dual wavelength optic. Copper or molybdenum X-ray radiation is available at the click of a button. The XtaLAB Synergy-DW offers up to 12x higher flux compared to the standard sealed tube X-ray sources and, utilizing only one generator, means overall maintenance is reduced. Rounding out the XtaLAB Synergy-DW configuration is the fast and efficient four-circle kappa goniometer which is compatible with a wide range of detectors including the HyPix-6000HE and other Hybrid Photon Counting (HPC) X-ray detectors e.g. PILATUS and EIGER detectors.

Benefits

  • Multi-functional diffractometer to cover you wherever your research takes you
  • High flux performance means you all your crystallography needs can be carried out ‘in-house’
  • Very little downtime and easy maintenance
  • No need to purchase extra software for different applications



  • Product name: XtaLAB Synergy-DW
  • Technique: Single crystal X-ray diffraction
  • Benefit: Fast structural analyses of a wide range of single crystals
  • Technology: Dual wavelength X-ray diffractometer
  • Core attributes: X-ray diffractometer with high-flux, dual wavelength X-ray source, kappa goniometer and HPC detector
  • Core options: Cryostream or Cobra coolers (Oxford Cryosystems), XtalCheck-S
  • Computer: External PC, MS Windows, CrysAlis Pro
  • Core dimensions: 130,0 (W) x 187,5 (H) x 85,0 (D) cm
  • Mass: 600 kg (core unit)
  • Power requirements: 1Ø, 200-230 V, 20 A

Crystals are regular arrays of atoms, and X-rays can be considered waves of electromagnetic radiation. Atoms scatter X-ray waves, primarily through the atoms’ electrons. Just as an ocean wave striking a lighthouse produces secondary circular waves emanating from the lighthouse, so an X-ray striking an electron produces secondary spherical waves emanating from the electron. This phenomenon is known as elastic scattering, and the electron (or lighthouse) is known as the scatterer. A regular array of scatterers produces a regular array of spherical waves. Although these waves cancel one another out in most directions through destructive interference, they add constructively in a few specific directions, determined by Bragg’s law. X-ray diffraction results from an electromagnetic wave (the X-ray) impinging on a regular array of scatterers (the repeating arrangement of atoms within the crystal). X-rays are used to produce the diffraction pattern because their wavelength is typically the same order of magnitude (1–100 angstroms) as the spacing between planes in the crystal. In principle, any wave impinging on a regular array of scatterers produces diffraction, as predicted first by Francesco Maria Grimaldi in 1665. To produce significant diffraction, the spacing between the scatterers and the wavelength of the impinging wave should be similar in size. For illustration, the diffraction of sunlight through a bird’s feather was first reported by James Gregory in the later 17th century. The first artificial diffraction gratings for visible light were constructed by David Rittenhouse in 1787, and Joseph von Fraunhofer in 1821. However, visible light has too long a wavelength (typically, 5500 angstroms) to observe diffraction from crystals. Prior to the first X-ray diffraction experiments, the spacings between lattice planes in a crystal were not known with certainty.The idea that crystals could be used as a diffraction grating for X-rays arose in 1912 in a conversation between Paul Peter Ewald and Max von Laue in the English Garden in Munich. Ewald had proposed a resonator model of crystals for his thesis, but this model could not be validated using visible light, since the wavelength was much larger than the spacing between the resonators. Von Laue realized that electromagnetic radiation of a shorter wavelength was needed to observe such small spacings, and suggested that X-rays might have a wavelength comparable to the unit-cell spacing in crystals. Von Laue worked with two technicians, Walter Friedrich and his assistant Paul Knipping, to shine a beam of X-rays through a copper sulfate crystal and record its diffraction on a photographic plate. After being developed, the plate showed a large number of well-defined spots arranged in a pattern of intersecting circles around the spot produced by the central beam. Von Laue developed a law that connects the scattering angles and the size and orientation of the unit-cell spacings in the crystal, for which he was awarded the Nobel Prize in Physics in 1914.