This high-resolution AFM (Atomic Force Microscope) of less than 25 mm diameter was designed to fit perfectly into the PPMS® (Physical Property Measurement System) of Quantum Design. It offers all common measurement modes, such as contact mode and intermittent contact mode, plus the PLL-controlled true non-contact mode and high-resolution MFM mode. Joining the AFM with the PPMS® provides the researcher with a versatile nanoscale imaging tool in a variable temperature and variable magnetic field environment. The broad temperature range of 4–400 K and the available magnetic field options of up to 16 T promise exciting new studies on phase transitions, superconductors, magnetic thin films, 2DEG, etc.
TEAM™ EDS Analysis System featuring Apollo XLT SDD Series provides the ultimate analytical solution for transmission electron microscope (TEM). The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use.
EDAX’s TEAM™ EBSD Analysis System is the most comprehensive system available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase-distribution information from single and polyphase crystalline materials through the collection and analysis of Electron Backscatter Diffraction (EBSD) patterns in a scanning electron microscope (SEM). TEAM™ EBSD Analysis System combines the ease of use of the TEAM™ software platform with the analytical power of OIM™ to provide state of the art crystal structure characterization to all users.
The TEAM™ WDS Analysis System pairs TEAM™ software with a parallel beam
WDS spectrometer. To complement EDS analysis for light element work, or
where elemental overlaps cause serious problems, the microanalyst often
employs a wavelength dispersive X-ray spectrometer (WDS). The improved
resolution and higher sensitivity of WDS deconvolutes peak overlaps and
effectively exposes trace elements, providing the user with a clear
picture of sample chemistry. Both qualitative and quantitative analyses
can be run.
Especially designed for research, development and quality control of magnetic storage media and other magnetic material, the hr-MFM (high-resolution Magnetic Force Microscope) is an analytical and quantitative magnetic imaging system. Its exceptionally high magnetic resolution of 10 nm or better matches the best results obtained by SEMPA (Scanning Electron Microscopy with Polarization Analysis) on disk media.The hr-MFM is a key instrument in the improvement of the current hard disk technology and is optimized for research and development departments of the data storage industry. In Research Centers and Universities it is an excellent tool to analyze surface structures and to characterize new magnetic materials and thin film technology, for example magnetic quantum dots and layered nanostructures for mRAM and FeRAM applications.