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Structural and chemical research

Single crystal X-ray difraction

The single crystal X-ray difraction technique is a simple and relatively cheap way of obtaining data about organic and inorganic molecules structure.

Small/wide angle X-ray scattering (SAXS/WAXS)

Leading edge solutions for nanomaterial studies.

PPMS AFM

Vendor: ION-TOF

This high-resolution AFM (Atomic Force Microscope) of less than 25 mm diameter was designed to fit perfectly into the PPMS® (Physical Property Measurement System) of Quantum Design. It offers all common measurement modes, such as contact mode and intermittent contact mode, plus the PLL-controlled true non-contact mode and high-resolution MFM mode. Joining the AFM with the PPMS® provides the researcher with a versatile nanoscale imaging tool in a variable temperature and variable magnetic field environment. The broad temperature range of 4–400 K and the available magnetic field options of up to 16 T promise exciting new studies on phase transitions, superconductors, magnetic thin films, 2DEG, etc.

Energy Dispersive X-ray Spectroscopy (EDS)

Vendor: EDAX

TEAM™ EDS Analysis System featuring Apollo XLT SDD Series provides the ultimate analytical solution for transmission electron microscope (TEM). The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use.

Electron Backscatter Diffraction (EBSD)

Vendor: EDAX

EDAX’s TEAM™ EBSD Analysis System is the most comprehensive system available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase-distribution information from single and polyphase crystalline materials through the collection and analysis of Electron Backscatter Diffraction (EBSD) patterns in a scanning electron microscope (SEM). TEAM™ EBSD Analysis System combines the ease of use of the TEAM™ software platform with the analytical power of OIM™ to provide state of the art crystal structure characterization to all users.

Wavelength Dispersive X-ray Spectrometry (WDS)

Vendor: EDAX

The TEAM™ WDS Analysis System pairs TEAM™ software with a parallel beam WDS spectrometer. To complement EDS analysis for light element work, or where elemental overlaps cause serious problems, the microanalyst often employs a wavelength dispersive X-ray spectrometer (WDS). The improved resolution and higher sensitivity of WDS deconvolutes peak overlaps and effectively exposes trace elements, providing the user with a clear picture of sample chemistry. Both qualitative and quantitative analyses can be run.

HR-MFM

Vendor: ION-TOF

Especially designed for research, development and quality control of magnetic storage media and other magnetic material, the hr-MFM (high-resolution Magnetic Force Microscope) is an analytical and quantitative magnetic imaging system. Its exceptionally high magnetic resolution of 10 nm or better matches the best results obtained by SEMPA (Scanning Electron Microscopy with Polarization Analysis) on disk media.The hr-MFM is a key instrument in the improvement of the current hard disk technology and is optimized for research and development departments of the data storage industry. In Research Centers and Universities it is an excellent tool to analyze surface structures and to characterize new magnetic materials and thin film technology, for example magnetic quantum dots and layered nanostructures for mRAM and FeRAM applications.