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Surface Analysis

Более подробная информация представлена на сайте www.surfaceanalysis.ru

Electron Microscopy (EM)

Сканирующая, просвечивающая электронная и ионная микроскопия, двулучевые системы

Time-of-Flight Secondary Ion Mass Spectrometry (TOF SIMS)

Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. TOF-SIMS is an acronym for the combination of the analytical technique SIMS (Secondary Ion Mass Spectrometry) with Time-of-Flight mass analysis (TOF).