Orbis Micro-XRF

Sensitive and flexible system for elemental analysis.


Orbis Micro-XRF EDAX spectrometers are the result of more than ten years of innovative work and the synthesis of extensive experience gained over this time. To be able to solve a wide range of analytical tasks, these desktop devices are available with both mono-capillary x-ray optics and ultra-high-intensity poly-capillary optics. Orbis systems are easily managed, have a large number of performance-enhancing features and are designed to examine samples of various types and shapes. X-ray sources, optics and detectors are guaranteed to provide the user with data of excellent quality. Orbis Vision software is adapted to solve both routine and complex non-standard tasks.

Key features and benefits:

  • Nondestructive analysis of samples with minimal sample preparation, the ability to work in low vacuum modes and environmental conditions;
  • A large vacuum chamber for samples and a large working distance allow you to explore a wide range of samples with complex topography without any loss of signal intensity;
  • The unique motorized head with integrated video and X-ray optics provides an opportunity to conduct coaxial X-ray analysis and obtain optical information about the sample for its most accurate positioning; optional 1 mm and 2 mm collimators of X-ray optics contribute to achieving maximum analytical flexibility;
  • A programmatically selected and controlled filtering system of a beam of six filters provides increased analysis sensitivity and removes spectral artifacts;
  • Software Orbis Vision has the ability to store data and control the system and allows you to solve a wide range of tasks on the quantitative and qualitative characteristics of samples.

Industry

  • Study of metal distribution in ceramic catalysts

The Orbis PC system was used to map the distribution of palladium in an extruded aluminum oxide bead. To limit the depth of the analysis, the Pd (L) line was used. Standard imaging methods show that palladium is predominantly contained in the form of a shell on the surface of the granule. However, the specialized scaling of the image, carried out using the EDAX software, revealed the content of palladium in the core of the granule, which was not detected by the previous test due to the significant difference in the concentration of the element in the core of the granule and in its shell.

 
 
  • Measurement of heavy components in products to meet RoHS requirements

The analysis of the content of limited and / or prohibited for distribution of materials and chemical elements in various products becomes an extremely important area. European law, in a particular firm adopted by many countries, prohibits the use of mercury, lead, cadmium, hexavalent chromium and bromine in consumer electronics and other devices. Micro-XRF analysis allows you to determine the levels of Hg, Pb and Cd, and evaluate the components with a significant content of Cr and Br, which should go on additional analyzes. The presented example illustrates the result of the mapping of the printed circuit board, indicating the use of lead-containing solder.

 
 
Non destructive analysis
 
  • Meteor exploration

To achieve an understanding of the structure of the meteorite “Odessa” – an extraterrestrial object that came to our planet tens of thousands of years ago – a large area of its cross section was studied (with elemental mapping).

 
 
 

Dimensions of the system (height X length X width): 910 mm X 720 mm X 500 mm;

Sample chamber dimensions: Diameter: 360 mm; Depth: 310 mm; it is possible to place a sample with dimensions up to 270 mm X 270 mm X 100 mm;

The range of measured elements: from Na to Bk;

Source of excitation: X-ray tube with side window, anode material – Rh (optionally available W, Mo, Cr);

Parameters of the tube: voltage from 10 to 50 kV, varies with a step of 1 kV; current strength from 0.05 to 1 mA, varies in increments of 5 μA;

Software controlled beam filter set;

SDD detector with an active area of ​​30 square millimeters (optional – 50 sq. mm.), resolution ≤135 eV at 30,000 counts per second;

Power supply network parameters: voltage from 90 to 260 V with a frequency of 47-63 Hz.