LEIS
The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterisation of the top atomic layer. This new generation instrument has been developed to include small spot analysis, surface imaging, and both static and dynamic depth profiling. Its unique surface sensitivity makes the Qtac the perfect tool to study surface processes. The Qtac provides valuable information in many production and research areas on materials such as catalysts, semiconductors, metals, polymers, fuel cells, and biomaterials.
Qtac 100
Specification
3000 times higher sensitivity than conventional LEIS instruments
Quantitative, elemental characterisation of the top atomic layer
Spectroscopy, imaging and depth profiling capabilities
Time-of-flight mass filtering for improved sensitivity
Analysis of rough and non-conductive materials
Application
The stand-alone version of the Qtac is based on a field-proven instrument platform. The modular design is ideal for customisation and the integration of a large variety of UHV preparation techniques. It is also possible to couple the Qtac100 to other floor standing instruments.