Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM) are used for inspecting topographies of materials with a magnification range that encompasses that of optical microscopy and extends it to the nanoscale. FEI offers a variety of advanced scanning electron microscopes (SEM) to meet customer requirements and application needs. An FEI scanning electron microscope (SEM) can scan the surface of a sample with a finely focused electron beam to produce an image from the beam-specimen interactions detected by a wide array of detectors. A variety of detectors are available, from secondary electron detectors to provide surface information, to backscattered detectors for compositional information in both high or low vacuum modes.
